Wykorzystanie spektroskopii Ramana w badaniach materiałów niskowymiarowych

Abstract

The presented dissertation focuses on the application of Raman spectroscopy in the study of low-dimensional systems. The main objectives included the integration of the Raman spectrometer with systems operating under controlled conditions, such as a glovebox with an inert gas atmosphere and an ultrahigh vacuum low-temperature scanning tunneling microscope system, as well as conducting investigations of low-dimensional materials using the developed system. The dissertation consists of five chapters, the last of which is a summary. Chapter 1 discusses research motivations, study objectives, and the theoretical foundations of the Raman effect, along with technical aspects of Raman spectroscopy. Chapter 2 details the design of a mapping Raman spectrometer integrated with a glovebox for argon-atmosphere measurements. Only essential components are placed inside. Subchapter 2.4 highlights the benefits of a protective atmosphere using hygroscopic Re₂O₇. Chapter 3 explores low-dimensional TMDC flakes of various polytypes. Data analysis enabled determining absorption coefficients and flake thickness. Anomalous Raman intensity dependence was examined, while tellurium-based flakes revealed unexpected metallic tellurium, prompting further studies. Chapter 4 discusses ultrahigh vacuum and low-temperature measurements, as well as the spectrometer’s integration with the vacuum system. A low-intensity silicon reference spectrum was obtained. Angle-dependent optical studies clarified results. Future work will expand the system for Tip-Enhanced Raman Spectroscopy mapping.